Neutron and X-ray Reflectometry

The field of ultra-thin films, a subgroup of nanomaterials, has seen an upsurge in research within the last 30 years. Studies have primarily been done using neutron and x-ray reflectometry. The technique of polarized neutron reflectometry or PNR is a unique non-destructive tool to understand thin film magnetism in mesoscopic length scale.

This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers. The text covers the basic principles of neutron and x-ray reflectivity and different mode of neutron reflectivity with many useful examples. The reference text is helpful for research students working in the field of interface magnetism in thin film and multilayers.

Key Features:

• Introduces the reader to the field of reflectometry, especially polarized neutron reflectometry and x-ray reflectometry.

• Familiarizes researchers with the importance of interface properties in thin films.

• Demonstrates with examples how properties can be determined with sub nanometre resolution.

• Provides a summary with a large number of contemporary examples and references.